Statistics
Publications
10
Citations
251
H-Index
10
Active since
2004
Ravi Achanta is an author at Rensselaer Polytechnic Institute specializing in materials science, electronic materials, and device reliability.
Publications per year
2004–2021
10
10
Line edge roughness and spacing effect on low-k TDDB characteristics
F. Chen, J. R. Lloyd, Kaushik Chanda et al. · 2008 · 46 citations
Critical ultra low-k TDDB reliability issues for advanced CMOS technologies
F. Chen, M. Shinosky, B. Li et al. · 2009 · 27 citations
Engineering, Electrical Engineering, Electronic Materials +16
A time-dependent clustering model for non-uniform dielectric breakdown
Ernest Y. Wu, Benzheng Li, J. H. Stathis et al. · 2013 · 25 citations
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