A time-dependent clustering model for non-uniform dielectric breakdown

Abstract

We report a time-dependent clustering model for non-uniform dielectric breakdown. While at high percentiles non-Possion area scaling dominates, the model restores the weakest-link characteristics at low percentiles relevant for reliability projection. Its validity is demonstrated by area scaling and excellent agreement with multiple experimental data sets. We show the clustering model can replace Weibull model with largely improved reliability margins.