P. McLaughlin

22nm High-performance SOI technology featuring dual-embedded stressors, Epi-Plate High-K deep-trench embedded DRAM and self-aligned Via 15LM BEOL

P. Chang, C. Ortolland, David Fried et al. · 2012 · 89 citations

High-performance Soi Technology, Engineering, Vlsi Design +16

High performance 65 nm SOI technology with enhanced transistor strain and advanced-low-K BEOL

W.-H. Lee, Anya M. Waite, H. Nii et al. · 2006 · 55 citations

Engineering, Vlsi Design, Integrated Circuits +19

Comparison of key fine-line BEOL metallization schemes for beyond 7 nm node

T. Nogami, Xingxing Zhang, James J. Kelly et al. · 2017 · 30 citations

Materials Engineering, Materials Science, Electrical Engineering +13

Limit behavior of fibrous materials

P. McLaughlin, Steven C. Batterman · International Journal of Solids and Structures · 1970 · 29 citations

Materials Science, Engineering, Mechanical Behavior +4

Plastic limit behavior and failure of filament reinforced materials

P. McLaughlin · International Journal of Solids and Structures · 1972 · 27 citations

Materials Science, Engineering, Mechanical Behavior +5