Concepedia

S. Golubović

SG

5

Publications

113

Citations

5

H-Index

1994

Active since

Affiliations

University of Nis(Current)

S. Golubović is an author at University of Nis specializing in electrical engineering, microelectronics, and engineering.

Top concepts

EngineeringMicroelectronicsElectrical EngineeringApplied PhysicsPower ElectronicsElectronic Engineering

Publications per year

1994–2011

5

Publications

5

NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs

Danijel Danković, I. Manić, S. Djoric-Veljković et al. · Microelectronics Reliability · 2006 · 35 citations

Electrical Engineering, Engineering, Nbt Stress-induced Degradation +8

Negative bias temperature instability in n-channel power VDMOSFETs

Danijel Danković, I. Manić, V. Davidović et al. · Microelectronics Reliability · 2008 · 31 citations

Electrical Engineering, N-channel Power Vdmosfets, Engineering +5

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions

I. Manić, Danijel Danković, Aneta Prijić et al. · Microelectronics Reliability · 2011 · 17 citations

Lifetime Estimation, Electrical Engineering, Engineering +10

Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs

Danijel Danković, I. Manić, V. Davidović et al. · Microelectronics Reliability · 2007 · 15 citations

Electrical Engineering, Engineering, Electronic Engineering +5

Separation of irradiation induced gate oxide chargeand interface traps effects in power VDMOSFETs

N. Stojadinović, S. Djorić, S. Golubović et al. · Electronics Letters · 1994 · 15 citations

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