Concepedia

Publication | Closed Access

Negative bias temperature instability in n-channel power VDMOSFETs

DOI

31

Citations

12

References

2008

Year

Danijel Danković, I. Manić, V. Davidović, S. Djoric-Veljković, S. Golubović, N. Stojadinović
Microelectronics Reliability

References

YearCitations

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