NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions - Concepedia

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NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions

17

Citations

16

References

2011

Year

I. Manić, Danijel Danković, Aneta Prijić, V. Davidović, S. Djoric-Veljković, S. Golubović, Zoran Prijić, N. Stojadinović

Microelectronics Reliability

Lifetime EstimationElectrical EngineeringEngineeringNbti Related DegradationStress-induced Leakage CurrentBias Temperature InstabilityApplied PhysicsPower Semiconductor DeviceCircuit ReliabilityP-channel Power VdmosfetsPower ElectronicsDevice ReliabilityMicroelectronics

References

	Year	Citations

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