Concepedia

Author

S.V. Walstra

Intel (United States)

Also Known As

S. Walstra, S.V. Walstra, Steven V. Walstra, Steven Walstra

8

Publications

496

Citations

7

H-Index

24

Concepts

All Affiliations

Intel (United States)University of Florida
SW

About

S.V. Walstra is an author at Intel (United States) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

7

7

492

2

Electrical Engineering

7

7

492

3

Computer Engineering

5

5

437

4

Applied Physics

4

4

250

5

Medicine

1

1

42

S.V. Walstra

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7

Publications

492

Citations

7

H-Index

YearCitations

Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-μm to 90-nm generation

P. Hazucha, Tanay Karnik, J. Maiz,

2004

153

Measurements and analysis of SER-tolerant latch in a 90-nm dual-V/sub T/ CMOS process

P. Hazucha, Tanay Karnik, S.V. Walstra,

IEEE Journal of Solid-State Circuits

2004

111

Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process

P. Hazucha, Tanay Karnik, S.V. Walstra,

2004

67

Circuit-level modeling of soft errors in integrated circuits

S.V. Walstra, Changhong Dai

IEEE Transactions on Device and Materials Reliability

2005

64

Thin oxide thickness extrapolation from capacitance-voltage measurements

S.V. Walstra, Chih‐Tang Sah

IEEE Transactions on Electron Devices

1997

42

Frequency and recovery effects in high-κ BTI degradation

S. Ramey, C. Prasad, M. Agostinelli,

IEEE International Reliability Physics Symposium proceedings

2009

42

EXTENSION OF THE McNUTT-SAH METHOD FOR MEASURING THIN OXIDE THICKNESSES OF MOS DEVICES

S.V. Walstra, Chih‐Tang Sah

Solid-State Electronics

1998

13

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