Changhong Dai

Impact of CMOS process scaling and SOI on the soft error rates of logic processes

S.A. Hareland, J. Maiz, M. Alavi et al. · 2002 · 119 citations

Hardware Security, Electrical Engineering, Engineering +14

Circuit-level modeling of soft errors in integrated circuits

S.V. Walstra, Changhong Dai · IEEE Transactions on Device and Materials Reliability · 2005 · 64 citations

Electrical Engineering, Reliability Engineering, Analytical Soft-error Rate +15

A Layered Finite Element Method for Electromagnetic Analysis of Large-Scale High-Frequency Integrated Circuits

Dan Jiao, Sourav Chakravarty, Changhong Dai · IEEE Transactions on Antennas and Propagation · 2007 · 51 citations

Numerical Analysis, Engineering, Computational Complexity +18

A novel technique for full-wave modeling of large-scale three-dimensional high-speed on/off-chip interconnect structures

Dan Jiao, Md. Mohiuddin Mazumder, S. Chakravarty et al. · 2003 · 36 citations

Engineering, Vlsi Design, Interconnect (Integrated Circuits) +16

Computational electromagnetics for high-frequency IC design

Dan Liao, Changhong Dai, Shiuh-Wuu Lee et al. · 2004 · 24 citations

Electrical Engineering, Physical Design (Electronics), Engineering +12