Karl-Henrik Ryden

Overlapping electron traps in <i>n</i>-type silicon studied by capacitance transient spectroscopy

Bengt Svensson, Karl-Henrik Ryden, B. M. S. Lewerentz · Journal of Applied Physics · 1989 · 164 citations

Engineering, Magnetic Resonance, Silicon On Insulator +18

Fast Wafer Level Reliability Monitoring: Quantification of Plasma-Induced Damage Detected on Productive Hardware

Andreas Martin, Christoph Bukethal, Karl-Henrik Ryden · IEEE Transactions on Device and Materials Reliability · 2009 · 32 citations

Engineering, Measurement, Productive Hardware +19

Thermal degradation of TiSi2/poly-Si gate electrodes

S. Nygren, Mikael Östling, C. S. Petersson et al. · Thin Solid Films · 1989 · 18 citations

Electrical Engineering, Engineering, Bias Temperature Instability +4

Electrical evaluation of high-temperature effects on gate oxide integrity in a self-aligned CoSi2 MOS process

Tord Karlin, Sui Zhang, Karl-Henrik Ryden et al. · Applied Surface Science · 1993 · 15 citations

Materials Science, Materials Engineering, Electrical Engineering +11