C. S. Petersson - Concepedia

Author

C. S. Petersson

Also Known As

C S Petersson, C Sture Petersson, C. S Petersson, C. S. PETERSSON, C. S. Petersson, C. Sture Petersson, C.S Petersson, C.S. Petersson, C.Sture Petersson

142

Publications

Citations

H-Index

Concepts

All Affiliations

KTH Royal Institute of Technology Uppsala University IBM Research - Thomas J. Watson Research Center Mid Sweden University IBM (United States)

About

C. S. Petersson is an author at KTH Royal Institute of Technology specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	27	55	2.6K
2	Applied Physics	26	48	2.3K
3	Health Sciences	9	9	259
4	Natural Sciences	5	5	346
5	Medicine	2	2	200

C. S. Petersson

Publications

2.7K

Citations

H-Index

Page 1

	Year	Citations
Formation of thin films of NiSi: Metastable structure, diffusion mechanisms in intermetallic compounds F. M. d’Heurle, C. S. Petersson, J. E. E. Baglin, Journal of Applied Physics Materials ScienceMaterials EngineeringMetastable StructureIntermetallic CompoundsCrystalline Defects	1984	250
Formation of thin films of CoSi2: Nucleation and diffusion mechanisms F. M. d’Heurle, C. S. Petersson Thin Solid Films Materials ScienceEngineeringSurface ScienceApplied PhysicsThin Film Process Technology	1985	211
Quantitative mass and energy dispersive elastic recoil spectrometry: Resolution and efficiency considerations Harry J. Whitlow, Göran Possnert, C. S. Petersson Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms EngineeringAnalytical InstrumentationPhysicsSpectroscopyMechanical Engineering	1987	182
The formation of silicides from thin films of some rare-earth metals J. E. E. Baglin, F. M. d’Heurle, C. S. Petersson Applied Physics Letters Materials ScienceRare Earth MineralEngineeringCrystalline DefectsSurface Science	1980	150
Diffusion marker experiments with rare-earth silicides and germanides: Relative mobilities of the two atom species J. E. E. Baglin, F. M. d’Heurle, C. S. Petersson Journal of Applied Physics EngineeringRelative MobilitiesChemistrySilicon On InsulatorSilicene	1981	138
Observations on the hexagonal form of MoSi2 and WSi2 films produced by ion implantation and on related snowplow effects F. M. d’Heurle, C. S. Petersson, M. Y. Tsai Journal of Applied Physics EngineeringChemistrySilicon On InsulatorIi-vi SemiconductorIon Implantation	1980	136
Enhanced formation of the C54 phase of TiSi2 by an interposed layer of molybdenum A. Mouroux, S.-L. Zhang, Wlodek Kaplan, Applied Physics Letters EngineeringSolid-state ChemistryChemistrySilicon On InsulatorSemiconductor Nanostructures	1996	96
A comparative study of the diffusion barrier properties of TiN and ZrN Mikael Östling, S. Nygren, C. S. Petersson, Thin Solid Films Materials ScienceMaterials EngineeringEngineeringDiffusion ResistancePhysics	1986	90
Thermal oxidation of transition metal silicides Hao Jiang, C. S. Petersson, M.−A. Nicolet Thin Solid Films EngineeringOxidation ResistanceSiliceneThermal OxidationThermodynamics	1986	89
Silicides of ruthenium and osmium: Thin film reactions, diffusion, nucleation, and stability C. S. Petersson, J. E. E. Baglin, J. Dempsey, Journal of Applied Physics Materials ScienceInorganic ChemistryOsmium Thin FilmsTransition Metal ChalcogenidesEngineering	1982	78

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