Kristof J. P. Jacobs

Author

University of Sheffield ORCID

Also Known As

K Jacobs, K. J. P. Jacobs, K. Jacobs, K.J.P. Jacobs, Kristof J. P. JACOBS, Kristof J. P. Jacobs, Kristof J.P. Jacobs

Publications

198

Citations

H-Index

Concepts

All Affiliations

University of Sheffield ROHM IMEC KU Leuven

About

Kristof J. P. Jacobs is an author at University of Sheffield specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	119
2	Applied Physics	6	6	119
3	Electrical Engineering	5	5	90
4	Physics	2	2	44
5	Crystalline Defects	1	1	15

Kristof J. P. Jacobs

Publications

119

Citations

H-Index

Page 1

	Year	Citations
Characterization of through-silicon vias using laser terahertz emission microscopy Kristof J. P. Jacobs, Hironaru Murakami, F. Murakami, Nature Electronics EngineeringOptical PropertiesApplied PhysicsTerahertz ScienceTerahertz Technique	2021	29
A Dual-Pass High Current Density Resonant Tunneling Diode for Terahertz Wave Applications Kristof J. P. Jacobs, B. Stevens, Osamu Wada, IEEE Electron Device Letters Electrical EngineeringTerahertz Wave ApplicationsEngineeringTunneling MicroscopyPhysics	2015	25
Reliability of p-GaN Gate HEMTs in Reverse Conduction Deepthi Cingu, Xiangdong Li, Benoit Bakeroot, IEEE Transactions on Electron Devices Semiconductor TechnologyElectrical EngineeringEngineeringPhysicsConduction Mode	2021	19
Non-destructive mapping of doping and structural composition of MOVPE-grown high current density resonant tunnelling diodes through photoluminescence spectroscopy Kristof J. P. Jacobs, B. Stevens, T. Mukai, Journal of Crystal Growth Electrical EngineeringEngineeringTunneling MicroscopyNon-destructive MappingApplied Physics	2015	17
Optical Beam-Based Defect Localization Methodologies for Open and Short Failures in Micrometer-Scale 3-D TSV Interconnects Kristof J. P. Jacobs, Yunlong Li, Michele Stucchi, IEEE Transactions on Components Packaging and Manufacturing Technology Optical MaterialsEngineeringMicroscopyOptical TestingIon Beam Instrumentation	2020	15
Valley current characterization of high current density resonant tunnelling diodes for terahertz-wave applications Kristof J. P. Jacobs, B. Stevens, Răzvan Baba, AIP Advances Wide-bandgap SemiconductorEngineeringValley Current CharacterizationThz EmissionSemiconductor Device	2017	14

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