T. Witters

Ternary rare-earth metal oxide high-k layers on silicon oxide

Chao Zhao, T. Witters, Bert Brijs et al. · Applied Physics Letters · 2005 · 133 citations · Full text

Materials Engineering, Semiconductors, Electrical Engineering +11

Highly reliable TaO<inf>x</inf> ReRAM with centralized filament for 28-nm embedded application

Y. Hayakawa, A. Himeno, Ryo Yasuhara et al. · 2015 · 85 citations

High Thermal Stability, Cell Structure, Engineering +20

Ovonic Threshold‐Switching Ge_<i>x</i>Se_<i>y</i> Chalcogenide Materials: Stoichiometry, Trap Nature, and Material Relaxation from First Principles

Sergiu Clima, Daniele Garbin, Karl Opsomer et al. · physica status solidi (RRL) - Rapid Research Letters · 2020 · 75 citations · Full text

Engineering, Solid-state Chemistry, Electronic Structure +21

Thermally stable integrated Se-based OTS selectors with &gt;20 MA/cm² current drive, &gt;3.10³ half-bias nonlinearity, tunable threshold voltage and excellent endurance

B. Govoreanu, Gabriele Luca Donadio, Karl Opsomer et al. · 2017 · 60 citations

Engineering, Functional Devices, Integrated Circuits +18

Implementation of an industry compliant, 5&amp;#x00D7;50&amp;#x03BC;m, via-middle TSV technology on 300mm wafers

A. Redolfi, Dimitrios Velenis, Sarasvathi Thangaraju et al. · 2011 · 52 citations

Engineering, Silicon Vias, Integrated Circuits +18