Statistics
Publications
17
Citations
444
H-Index
13
Active since
1968
M. Koike is an author at Toshiba (Japan) specializing in materials science, electronic materials, and semiconductor device materials.
Publications per year
1968–2014
17
17
Effects of nitrogen in HfSiON gate dielectric on the electrical and thermal characteristics
M. Koyama, A. Kaneko, Tsunehiro Ino et al. · 2003 · 77 citations
Koji Usuda, Yoshiki Kamata, Yuuichi Kamimuta et al. · Applied Physics Express · 2014 · 75 citations
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