Keith Forbes

Comparisons of soft error rate for SRAMs in commercial SOI and bulk below the 130-nm technology node

Ph. Roche, Gilles Gasiot, Keith Forbes et al. · IEEE Transactions on Nuclear Science · 2003 · 92 citations

Electrical Engineering, Bulk Srams, Vlsi Design +12

A Comprehensive Study on the Soft-Error Rate of Flip-Flops From 90-nm Production Libraries

Tino Heijmen, Philippe Roche, Gilles Gasiot et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 68 citations

Flip-flops From 90-Nm, Engineering, Vlsi Design +22

A Comparative Study on the Soft-Error Rate of Flip-Flops from 90-nm Production Libraries

Tino Heijmen, Philippe Roché, Gilles Gasiot et al. · 2006 · 26 citations

Engineering, Vlsi Design, Computer Architecture +20

Realistic Projections of Product Fails from NBTI and TDDB

A. Haggag, M. Moosa, N. Liu et al. · 2006 · 24 citations

Engineering, Nuclear Physics, Computer Architecture +19

Characterization of the time-dependent reliability fallout as a function of yield for a 130nm SRAM device and application to optimize production burn-in

Keith Forbes, P. Schani · 2004 · 16 citations

Engineering, Computer Architecture, System Reliability +19