P. Schani is an author at Motorola (United States) specializing in engineering, electrical engineering, and microelectronics.
Top concepts
EngineeringMicroelectronicsElectrical EngineeringReliabilityComputer EngineeringComputer ArchitectureReliability EngineeringPhysicsApplied PhysicsNuclear Physics
Publications per year
2003–2006
3
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Realistic Projections of Product Fails from NBTI and TDDB
Substrate bias dependent leakage in LDD MOSFETs
J. Sweeney, N. Herr, P. Schani et al. · 2003 · 11 citations
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