B. Fodness

Evidence for angular effects in proton-induced single-event upsets

Robert A. Reed, Paul W. Marshall, H.S. Kim et al. · IEEE Transactions on Nuclear Science · 2002 · 71 citations

Engineering, Electrical Engineering, Physics +13

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

Robert A. Reed, Paul W. Marshall, J.C. Pickel et al. · IEEE Transactions on Nuclear Science · 2003 · 69 citations

Engineering, Electrical Engineering, Electronic Materials +15

Radiation-induced charge collection in infrared detector arrays

J.C. Pickel, Robert A. Reed, Ray Ladbury et al. · IEEE Transactions on Nuclear Science · 2002 · 22 citations

Engineering, Computational Engineering, Radiation Detection +16

Angular dependence of multiple-bit upsets induced by protons in a 16 mbit DRAM

S. Büchner, A.B. Campbell, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2004 · 18 citations

Engineering, Computer Engineering, Physics +9

Proton radiation testing of digital micromirror devices for space applications

Kenneth D. Fourspring, Zoran Ninkov, B. Fodness et al. · Optical Engineering · 2013 · 13 citations

Engineering, Aerospace Engineering, Microelectromechanical Systems +14