B. Truijen

Defect profiling in FEFET Si:HfO2 layers

Barry O’Sullivan, V. Putcha, Roman Izmailov et al. · Applied Physics Letters · 2020 · 33 citations · Full text

Ferroelectric Si-doped Hfo2, Electrical Engineering, Semiconductor Device +13

Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET

Zhicheng Wu, J. Franco, B. Truijen et al. · IEEE Transactions on Electron Devices · 2021 · 16 citations · Full text

Device Modeling, Electrical Engineering, Engineering +13

Fundamental understanding of NBTI degradation mechanism in IGZO channel devices

Ying Zhao, Pietro Rinaudo, Adrian Chasin et al. · 2024 · 12 citations

On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment

Mischa Thesberg, Md Nur K. Alam, B. Truijen et al. · IEEE Transactions on Electron Devices · 2022 · 10 citations · Full text

Dielectric Response in Ferroelectrics Near Polarization Switching: Analytical Calculations, First-Principles Modeling, and Experimental Verification

Sergiu Clima, Anne S. Verhulst, Pratik Bagul et al. · IEEE Transactions on Electron Devices · 2022 · 10 citations