Alvin L. S. Loke

Microstructure and reliability of copper interconnects

Changsup Ryu, Kee-Won Kwon, Alvin L. S. Loke et al. · IEEE Transactions on Electron Devices · 1999 · 185 citations

Engineering, Cvd Cu, Chemical Deposition +17

Kinetics of copper drift in low-κ polymer interlevel dielectrics

Alvin L. S. Loke, J. T. Wetzel, P. H. Townsend et al. · IEEE Transactions on Electron Devices · 1999 · 135 citations

Materials Science, Materials Engineering, Electrical Engineering +13

Kinetics of copper drift in PECVD dielectrics

Alvin L. S. Loke, Changsup Ryu, C. Patrick Yue et al. · IEEE Electron Device Letters · 1996 · 99 citations

Materials Engineering, Materials Science, Electrical Engineering +14

A Versatile 90-nm CMOS Charge-Pump PLL for SerDes Transmitter Clocking

Alvin L. S. Loke, Robert K. Barnes, Tin Tin Wee et al. · IEEE Journal of Solid-State Circuits · 2006 · 68 citations

Low-power Electronics, Electrical Engineering, Ps Rms Jitter +13

Demonstration of scaled (⩾0.12 μm2) Pb(Zr,Ti)O3 capacitors on W plugs with Al interconnect

Scott R. Summerfelt, T. S. Moise, Guoqiang Xing et al. · Applied Physics Letters · 2001 · 39 citations

Materials Science, Materials Engineering, Electrical Engineering +14