Tom Meuse

Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps

R.A. Ashton, B. E. Weir, George H. Weiss et al. · 2004 · 32 citations

Electrical Engineering, Engineering, High Voltage Engineering +7

Developing a transient induced latch-up standard for testing integrated circuits

Mary Alexandria Kelly, L. Henry, Jon Barth et al. · 2003 · 25 citations

Electrical Engineering, Latch Event, Engineering +14

Formation and suppression of a newly discovered secondary EOS event in HBM test systems

Tom Meuse, Larry Ting, Joe Schichl et al. · 2004 · 22 citations

Electrical Engineering, Secondary Eos Event, New Technologies +11

Investigation into socketed CDM (SDM) tester parasitics

M. Chaine, K. Verhaege, L. Avery et al. · 1998 · 12 citations

Electrical Engineering, Sdm Failure, Engineering +13

CDM2 — A new CDM test method for improved test repeatability and reproducibility

Robert Given, Marcos Hernandez, Tom Meuse · Electrical Overstress/Electrostatic Discharge Symposium · 2010 · 10 citations

Reliability, Electrical Engineering, Engineering +14