Publication | Closed Access
Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps
32
Citations
6
References
2004
Year
Unknown Venue
Electrical EngineeringEngineeringHigh Voltage EngineeringLow Hbm VoltageLow Leakage ClampsPower Supply ClampsPower ElectronicsHbm StressMicroelectronicsHbm Pulse
HBM and TLP measurements on dynamically triggered CMOS power supply clamps were found to be inconsistent for low leakage clamps. The failures at low HBM voltage were found to be due to a voltage ramp leading up to the HBM pulse which prevented the clamps from turning on.
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