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Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps

32

Citations

6

References

2004

Year

Abstract

HBM and TLP measurements on dynamically triggered CMOS power supply clamps were found to be inconsistent for low leakage clamps. The failures at low HBM voltage were found to be due to a voltage ramp leading up to the HBM pulse which prevented the clamps from turning on.

References

YearCitations

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