Joe Schichl

CDM peak current variations and impact upon CDM performance thresholds

Agha Jahanzeb, Yen-Yi Lin, S. Marum et al. · 2007 · 37 citations

Engineering, Electrical Engineering, Materials Science +11

Formation and suppression of a newly discovered secondary EOS event in HBM test systems

Tom Meuse, Larry Ting, Joe Schichl et al. · 2004 · 22 citations

Engineering, Electrical Engineering, Fault-tolerant Computing +11

A new I/O signal latchup phenomenon in voltage tolerant ESD protection circuits

Jorge Salcedo-Suñer, Roger Cline, C. Duvvury et al. · 2003 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +10

Integration of TLP analysis for ESD troubleshooting

Li-Moum Ting, C. Duvvury, O. Trevino et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2001 · 10 citations

Engineering, Electrical Engineering, Hazard Identification +6