Concepedia

M. Chaine

MC

Statistics

Publications

8

Citations

152

H-Index

8

Active since

1995

Affiliations

Texas Instruments (United States)(Current)

IBM (United States)

Conexant (United States)

Micron (United States)

Intel (United States)

M. Chaine is an author at Texas Instruments (United States) specializing in engineering, electrical engineering, and microelectronics.

Top concepts

EngineeringElectrical EngineeringMicroelectronicsComputer EngineeringSoftware TestingDesign For TestingReliabilityVlsi DesignFailure AnalysisSystems Engineering

Publications per year

1995–2003

8

Publications

8

A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies

Steven H. Voldman, Warren Anderson, R.A. Ashton et al. · 2003 · 25 citations

Electrical Engineering, Esd Metrics, Engineering +13

Developing a transient induced latch-up standard for testing integrated circuits

Mary Alexandria Kelly, L. Henry, Jon Barth et al. · 2003 · 25 citations

Electrical Engineering, Latch Event, Engineering +14

A correlation study between different types of CDM testers and "real" manufacturing in-line leakage failures

M. Chaine, Chen Teck Liong, Ho Fock San · IEEE Transactions on Components Packaging and Manufacturing Technology Part A · 1995 · 24 citations

Engineering, Mem Testing, Different Types +17

Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD)

Steven H. Voldman, R.A. Ashton, Jon Barth et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2003 · 21 citations

Transmission Line Pulse, Electrical Engineering, Engineering +15

Unique ESD failure mechanisms during negative to Vcc HBM tests

M. Chaine, S. Smith, Anh Tuan Bui · Microelectronics Reliability · 1998 · 20 citations

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