Alberto Cestero

Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips

Norm Robson, John Safran, C. Kothandaraman et al. · 2007 · 81 citations

Engineering, Computer Engineering, Electrical Engineering +7

Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI Embedded DRAM

Sami Rosenblatt, Daniel Fainstein, Alberto Cestero et al. · IEEE Journal of Solid-State Circuits · 2013 · 50 citations

Engineering, Computer Engineering, Electrical Engineering +12

An 800-MHz embedded DRAM with a concurrent refresh mode

T. Kirihata, P. Parries, David R. Hanson et al. · IEEE Journal of Solid-State Circuits · 2005 · 50 citations

Engineering, Computer Engineering, Computer Science +17

Scaling deep trench based eDRAM on SOI to 32nm and Beyond

G. Wang, D. Anand, Nauman Zafar Butt et al. · 2009 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Self-Authenticating Chip Architecture Using an Intrinsic Fingerprint of Embedded DRAM

Sami Rosenblatt, Srivatsan Chellappa, Alberto Cestero et al. · IEEE Journal of Solid-State Circuits · 2013 · 35 citations

Engineering, Computer Engineering, Electrical Engineering +16