O. Ohlsson

Evaluating probes for “electrical” atomic force microscopy

Thomas Trenkler, Thomas Hantschel, R. J. Stephenson et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 62 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Piezoresistive sensors on AFM cantilevers with atomic resolution

R. Jumpertz, A. van der Hart, O. Ohlsson et al. · Microelectronic Engineering · 1998 · 36 citations

Engineering, Materials Engineering, Materials Science +16

Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams

Hans‐Ulrich Danzebrink, Th. Dziomba, T. Sulzbach et al. · Journal of Microscopy · 1999 · 21 citations

Natural Sciences, Materials Engineering, Materials Science +17

Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

C. Lehrer, L. Frey, S. Petersen et al. · Microelectronic Engineering · 2001 · 20 citations

Engineering, Biomedical Engineering, Materials Science +14

Near-field optoelectronic detector probes based on standard scanning force cantilevers

Hans‐Ulrich Danzebrink, Günter Wilkening, O. Ohlsson · Applied Physics Letters · 1995 · 19 citations

Natural Sciences, Electrical Engineering, Physics +15