Hans‐Ulrich Danzebrink

Author

Also Known As

H U Danzebrink, H. Danzebrink, H. U. DANZEBRINK, H. U. Danzebrink, H.-U Danzebrink, H.-U. Danzebrink, H.U. Danzebrink, H.‐U. Danzebrink, Hans Ulrich Danzebrink, Hans-Ulrich Danzebrink

Publications

1.6K

Citations

H-Index

Concepts

All Affiliations

Physikalisch-Technische Bundesanstalt Schott (Germany)Fraunhofer Institute for Integrated Circuits National Physical Laboratory National Institute of Advanced Industrial Science and Technology

About

Hans‐Ulrich Danzebrink is an author at Physikalisch-Technische Bundesanstalt specializing in engineering, microscopy, and instrumentation.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	20	30	1.3K
2	Applied Physics	16	22	778
3	Education	7	7	408
4	Medicine	7	7	245
5	Natural Sciences	1	1	64

Hans‐Ulrich Danzebrink

Publications

1.5K

Citations

H-Index

Page 1

	Year	Citations
Metrological large range scanning probe microscope Gaoliang Dai, Frank Pohlenz, Hans‐Ulrich Danzebrink, Review of Scientific Instruments EngineeringAbbe OffsetMicroscopyMeasurementMechanical Engineering	2004	149
Critical review of the current status of thickness measurements for ultrathin SiO <sub>2</sub> on Si Part V: Results of a CCQM pilot study M. P. Seah, Steven J. Spencer, Farid Bensebaa, Surface and Interface Analysis	2004	139
Advances in Scanning Force Microscopy for Dimensional Metrology Hans‐Ulrich Danzebrink, Ludger Koenders, Günter Wilkening, CIRP Annals EngineeringMicroscopy MethodMicroscopyScanning Probe MicroscopyMechanical Engineering	2006	137
Accurate and traceable calibration of two-dimensional gratings Gaoliang Dai, Frank Pohlenz, Thorsten Dziomba, Measurement Science and Technology EngineeringMicroscopyMeasurementInterferometrySpm Results	2007	110
Accurate and traceable calibration of one-dimensional gratings Gaoliang Dai, Ludger Koenders, Frank Pohlenz, Measurement Science and Technology EngineeringMicroscopyMeasurementInterferometrySpm Results	2005	110
The European nanometrology landscape Richard Leach, Robert Boyd, T. M. Burke, Nanotechnology Materials ScienceNanosensorsNanoscale SystemEngineeringChemical Nanometrology	2011	83
Accurate and traceable measurement of nano- and microstructures Gaoliang Dai, Frank Pohlenz, Min Xu, Measurement Science and Technology NanosensorsEngineeringMicroscopyMeasurementMechanical Engineering	2006	75
A high precision micro/nano CMM using piezoresistive tactile probes Gaoliang Dai, Sebastian Bütefisch, Frank Pohlenz, Measurement Science and Technology Tactile SensingEngineeringMetrological SfmMicroscopyMicrofabrication	2009	73
A metrological large range atomic force microscope with improved performance Gaoliang Dai, Helmut Wolff, Frank Pohlenz, Review of Scientific Instruments EngineeringMicroscopyMeasurementMechanical EngineeringInterferometry	2009	64
Atomic force probe for sidewall scanning of nano- and microstructures Gaoliang Dai, Helmut Wolff, Frank Pohlenz, Applied Physics Letters EngineeringAfm TipMicroscopyMechanical EngineeringMicro-electromechanical System	2006	59

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