Ludger Koenders - Concepedia

Author

Ludger Koenders

Physikalisch-Technische Bundesanstalt ORCID

Also Known As

Dr. Ludger Koenders, Jens Fluegge, Koenders Ludger, Koenders, Ludger, L Koenders, L. Koenders, Ludger Koenders

105

Publications

Citations

H-Index

109

Concepts

All Affiliations

Physikalisch-Technische Bundesanstalt National Physical Laboratory University of Duisburg-Essen Dublin City University Istituto Nazionale di Ricerca Metrologica

About

Ludger Koenders is an author at Physikalisch-Technische Bundesanstalt specializing in engineering, applied physics, and microscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	23	39	1.7K
2	Education	10	10	449
3	Medicine	6	6	394
4	Natural Sciences	4	4	182
5	Health Sciences	1	1	19

Ludger Koenders

Publications

1.7K

Citations

H-Index

Page 1

	Year	Citations
Aspects of scanning force microscope probes and their effects on dimensional measurement Andrew Yacoot, Ludger Koenders Journal of Physics D Applied Physics EngineeringMeasurementMicroscopyMechanical EngineeringVarious Tip–sample Interactions	2008	156
Advances in Scanning Force Microscopy for Dimensional Metrology Hans‐Ulrich Danzebrink, Ludger Koenders, Günter Wilkening, CIRP Annals EngineeringMicroscopy MethodMicroscopyScanning Probe MicroscopyMechanical Engineering	2006	137
Accurate and traceable calibration of two-dimensional gratings Gaoliang Dai, Frank Pohlenz, Thorsten Dziomba, Measurement Science and Technology EngineeringMicroscopyMeasurementInterferometrySpm Results	2007	110
Accurate and traceable calibration of one-dimensional gratings Gaoliang Dai, Ludger Koenders, Frank Pohlenz, Measurement Science and Technology EngineeringMicroscopyMeasurementInterferometrySpm Results	2005	110
Recent developments in dimensional nanometrology using AFMs Andrew Yacoot, Ludger Koenders Measurement Science and Technology EngineeringMicroscopyMeasurementDimensional NanometrologyElectron Microscopy	2011	90
Photoelectron core-level spectroscopy and scanning-tunneling-microscopy study of the sulfur-treated GaAs(100) surface Philip Moriarty, Bridget M. Murphy, L. Roberts, Physical review. B, Condensed matter Photoelectron Core-level SpectroscopyEngineeringChemistrySulfur-treated GaasTunneling Microscopy	1994	86
The European nanometrology landscape Richard Leach, Robert Boyd, T. M. Burke, Nanotechnology Materials ScienceNanosensorsNanoscale SystemEngineeringChemical Nanometrology	2011	83
Accurate and traceable measurement of nano- and microstructures Gaoliang Dai, Frank Pohlenz, Min Xu, Measurement Science and Technology NanosensorsEngineeringMicroscopyMeasurementMechanical Engineering	2006	75
A landmark-based 3D calibration strategy for SPM Martin Ritter, Thorsten Dziomba, Axel Kranzmann, Measurement Science and Technology EngineeringMeasurementMicroscopyVertical CalibrationNanomarker Coordinates	2007	73
Comparison on Nanometrology: Nano 2—Step height Ludger Koenders, R.H. Bergmans, Joergen Garnaes, Metrologia Materials ScienceEngineeringPhysicsNanomaterialsNanotechnology	2003	62

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