Frank Pohlenz

Metrological large range scanning probe microscope

Gaoliang Dai, Frank Pohlenz, Hans‐Ulrich Danzebrink et al. · Review of Scientific Instruments · 2004 · 149 citations

Engineering, Abbe Offset, Microscopy +21

Accurate and traceable calibration of two-dimensional gratings

Gaoliang Dai, Frank Pohlenz, Thorsten Dziomba et al. · Measurement Science and Technology · 2007 · 110 citations

Engineering, Microscopy, Measurement +16

Accurate and traceable calibration of one-dimensional gratings

Gaoliang Dai, Ludger Koenders, Frank Pohlenz et al. · Measurement Science and Technology · 2005 · 110 citations

Engineering, Microscopy, Measurement +16

Accurate and traceable measurement of nano- and microstructures

Gaoliang Dai, Frank Pohlenz, Min Xu et al. · Measurement Science and Technology · 2006 · 75 citations

Nanosensors, Engineering, Microscopy +27

A high precision micro/nano CMM using piezoresistive tactile probes

Gaoliang Dai, Sebastian Bütefisch, Frank Pohlenz et al. · Measurement Science and Technology · 2009 · 73 citations

Tactile Sensing, Engineering, Metrological Sfm +15