Concepedia

B. Parameshwaran

BP

Statistics

Publications

4

Citations

110

H-Index

4

Active since

2009

Affiliations

GlobalFoundries (United States)(Current)

B. Parameshwaran is an author at GlobalFoundries (United States) specializing in microelectronics, electrical engineering, and engineering.

Top concepts

EngineeringMicroelectronicsElectrical EngineeringReliabilityComputer EngineeringNanoelectronicsReliability EngineeringMeasurementVlsi DesignApplied Physics

Publications per year

2009–2017

4

Publications

4

Accurate product lifetime predictions based on device-level measurements

T. Nigam, B. Parameshwaran, G. Krause · 2009 · 38 citations

Engineering, Hci Damage, Measurement +17

Impact of AC voltage stress on core NMOSFETs TDDB in FinFET and planar technologies

Rakesh Ranjan, Y. Liu, T. Nigam et al. · 2017 · 32 citations

Ac Voltage Stress, Engineering, Vlsi Design +17

Device reliability metric for end-of-life performance optimization based on circuit level assessment

A. Kerber, P. Srinivasan, S. Cimino et al. · 2017 · 27 citations

Engineering, Computer Architecture, Circuit Level Assessment +16

Intrinsic dielectric stack reliability of a high performance bulk planar 20nm replacement gate high-k metal gate technology and comparison to 28nm gate first high-k metal gate process

William E. McMahon, C. Tian, Suresh Uppal et al. · 2013 · 13 citations

Reliability, Electrical Engineering, Engineering +15

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