Proceedings of the European Solid State Device Research Conference

Double Gate Tunnel FET with ultrathin silicon body and high-k gate dielectric

Kathy Boucart, Adrian M. Ionescu · 2006 · 104 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Impact of Random Dopant Fluctuation on Bulk CMOS 6-T SRAM Scaling

B. Cheng, S. Roy, G. Roy et al. · 2006 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +17

Highly Reliable TiN/ZrO2/TiN 3D Stacked Capacitors for 45 nm Embedded DRAM Technologies

A. Berthelot, C. Caillat, V. Huard et al. · 2006 · 27 citations

Engineering, Electrical Engineering, Materials Science +17

Integrated Micromechanical Circuits for RF Front Ends

Clark T.‐C. Nguyen · 2006 · 26 citations

Engineering, Electrical Engineering, Microelectromechanical Systems +12

Al2O3 Based Flash Interpoly Dielectrics: a Comparative Retention Study

D. Wellekens, Pieter Blomme, B. Govoreanu et al. · 2006 · 23 citations

Engineering, Materials Engineering, Materials Science +16