A. Berthelot

Evolution of materials technology for stacked-capacitors in 65nm embedded-DRAM

E. Gerritsen, N. Emonet, C. Caillat et al. · Solid-State Electronics · 2005 · 98 citations

Materials Engineering, Materials Science, Electrical Engineering +5

Low temperature deposition of nanocrystalline silicon carbide thin films

S. Kerdilès, A. Berthelot, F. Gourbilleau et al. · Applied Physics Letters · 2000 · 83 citations

Materials Science, Engineering, Pure Hydrogen Plasma +11

Measurement of the neutral to charged current cross section ratio in neutrino and antineutrino interactions

M. Holder, J. Knobloch, J. May et al. · Physics Letters B · 1977 · 65 citations

Neutrino Property, Physics, Long Baseline Neutrino Experiment +6

1.3 mm² Nav-Grade NEMS-Based Gyroscope

Marco Gadola, Andrea Buffoli, Marc Sansa et al. · Journal of Microelectromechanical Systems · 2021 · 55 citations · Full text

Engineering, Measurement, Mechanical Engineering +18

Single pion production in π−-p interactions at 2.75 GeV/c

J.P. Baton, A. Berthelot, B. Deler et al. · Il Nuovo Cimento · 1965 · 49 citations

Nuclear Physics, Physics, Natural Sciences +3