2020 · 10 citations · 8 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesBipolar Junction TransistorsComplementary Metal-oxide-semiconductor TechnologyMetal-oxide-semiconductor Field-effect TransistorsShort-channel EffectsBreakdown VoltageHigh-voltage BreakdownSchottky Barrier CharacteristicsSchottky Barrier ContactsSchottky Barrier DiodesSchottky BarriersVoltage
This paper introduces the first application of a Schottky source approach for the purpose of expanding the Electrical Safe Operating Area (E-SOA) of a HV Transistor. Replacing the conventional PN source with a Schottky source suppresses the parasitic BJT enabling significant improvement in the E-SOA, particularly for very fast pulses. Under these conditions, improvement in the trigger voltage and current of a 40V n-LDMOS is 5.6% and 117% respectively. The breakdown voltage of 57V is maintained and a competitive on-resistance of 31.5 mOhm.mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> achieved.
8
N-Type Schottky Barrier Source/Drain MOSFET Using Ytterbium Silicide
S. Zhu, Kevin J. Chen, M.-F. Li et al. · IEEE Electron Device Letters · 2004 · 207 citations
A Rugged LDMOS for LBC5 Technology
J. Lin P. Hower · 2005 · 72 citations
Engineering, Electrical Engineering, Electronic Materials +7