Nature Electronics · 2020 · 46 citations · 24 references
Materials ScienceEngineeringTunnelling MicroscopeTunneling MicroscopyMicroscopyNanotechnologyMicrofabricationMicroscopy MethodApplied PhysicsScanning Probe MicroscopyMicroelectronics
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Device scaling limits of Si MOSFETs and their application dependencies
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Storing quantum information for 30 seconds in a nanoelectronic device
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Atomically Precise Placement of Single Dopants in Si
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Controlled nanoscale doping of semiconductors via molecular monolayers
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