Claudia Fleischmann

Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy

Péter Hermann, Arne Hoehl, G. Ulrich et al. · Optics Express · 2014 · 70 citations · Full text

Enabling the high-performance InGaAs/Ge CMOS: a common gate stack solution

Dennis Lin, Guy Brammertz, Sonja Sioncke et al. · 2009 · 60 citations

Hardware Security, Progressive Eot Scaling, Electrical Engineering +14

Bipolar device fabrication using a scanning tunnelling microscope

Tomáš Škereň, S. A. Köster, Bastien Douhard et al. · Nature Electronics · 2020 · 46 citations · Full text

Materials Science, Engineering, Tunnelling Microscope +8

Dopant, composition and carrier profiling for 3D structures

Wilfried Vandervorst, Claudia Fleischmann, Janusz Bogdanowicz et al. · Materials Science in Semiconductor Processing · 2016 · 45 citations

Geometric Modeling, Engineering, Natural Sciences +7

Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry

Matthias Müller, Philipp Hönicke, Blanka Detlefs et al. · Materials · 2014 · 44 citations · Full text