IEEE Solid-State Circuits Letters · 2018 · 53 citations · 7 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingMicroelectronicsSemiconductor DevicesBuilt-in Self-testDesign For TestabilityDevice CharacterizationDevice ReliabilityPhysical Unclonable FunctionsSemiconductor ReliabilityElectronic Physical Unclonable FunctionsError Correction CodesPhysically Unclonable FunctionsProcess CornersSilicon Physical Unclonable FunctionsSram Physical Unclonable Functions
A modified weak SRAM physical unclonable function (PUF) is proposed which is much more reliable than prior-art SRAM PUFs. The proposed PUF was fabricated in TSMC 65-nm process. A novel preselection test was run on these PUF arrays and is shown to eliminate all of the unstable cells (20%-25%). This PUF can drastically reduce the need for error correction codes. In addition, the preselection test can be accomplished in one VDD/temperature corner, which reduces the testing cost of finding unstable bits across many such corners, as is done in the prior art.
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Physical Unclonable Functions and Public-Key Crypto for FPGA IP Protection
Jorge Guajardo, Sandeep Kumar, Geert-Jan Schrijen et al. · 2007 · 209 citations