Avi Miller

I/sub DDQ/ testing in deep submicron integrated circuits

Avi Miller · 2003 · 77 citations

Engineering, Computer Engineering, Electrical Engineering +11

A Method to Improve Reliability in a 65-nm SRAM PUF Array

Yizhak Shifman, Avi Miller, Osnat Keren et al. · IEEE Solid-State Circuits Letters · 2018 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +15

An SRAM-Based PUF With a Capacitive Digital Preselection for a 1E-9 Key Error Probability

Yizhak Shifman, Avi Miller, Osnat Keren et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 2020 · 51 citations

Engineering, Computer Engineering, Electrical Engineering +17

Identifying defects in deep-submicron CMOS ICs

J.M. Soden, C.F. Hawkins, Avi Miller · IEEE Spectrum · 1996 · 46 citations

Engineering, Computer Engineering, Electrical Engineering +14

A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10

Avi Miller, Yizhak Shifman, Yoav Weizman et al. · 2019 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +13