Applied Surface Science · 2018 · 16 citations · 25 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDetector TechnologyDevice CharacterizationPhotodetectorsSemiconductor DetectorsSemiconductor Device MaterialsSemiconductor PhysicsSchottky Barrier CharacteristicsSchottky Barrier ContactsSchottky Barrier DetectorsSchottky Barrier PhotodetectorsSchottky BarriersSilicon CarbideSilicon Carbide (Sic) Materials
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Contact resistance measurements on <i>p</i>-type 6H-SiC
J. Crofton, P. A. Barnes, John R. Williams et al. · Applied Physics Letters · 1993 · 124 citations