Highly stable ITO/Zn<sub>2</sub>TiO<sub>4</sub>/Pt resistive random access memory and its application in two-bit-per-cell

Shi-Xiang Chen, Sheng-Po Chang, Sheng-Po Chang, Wei-Kang Hsieh, Chih‐Chien Lin

RSC Advances · 2018 · 17 citations · 31 references

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Abstract

We discuss the fabrication procedure and device characteristics of ITO/Zn<sub>2</sub>TiO<sub>4</sub>/Pt resistive random-access memory (RRAM) at room temperature.

References

31