Ugo Russo

Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices

Ugo Russo, Daniele Ielmini, C. Cagli et al. · IEEE Transactions on Electron Devices · 2009 · 376 citations

Non-volatile Memory, Electrical Engineering, Unipolar Resistive-switching Memory +15

Filament Conduction and Reset Mechanism in NiO-Based Resistive-Switching Memory (RRAM) Devices

Ugo Russo, Daniele Ielmini, C. Cagli et al. · IEEE Transactions on Electron Devices · 2009 · 354 citations

Electrical Engineering, Reset Mechanism, Engineering +15

Study of Multilevel Programming in Programmable Metallization Cell (PMC) Memory

Ugo Russo, Deepak Kamalanathan, Daniele Ielmini et al. · IEEE Transactions on Electron Devices · 2009 · 318 citations

Non-volatile Memory, Engineering, Conductive Bridging Ram +22

Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM

Ugo Russo, Daniele Ielmini, C. Cagli et al. · 2007 · 139 citations

Non-volatile Memory, Engineering, Nio-based Rram +16

Modeling of Programming and Read Performance in Phase-Change Memories—Part I: Cell Optimization and Scaling

Ugo Russo, Daniele Ielmini, Andrea Redaelli et al. · IEEE Transactions on Electron Devices · 2008 · 115 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +24