Microelectronics Reliability · 2018 · 40 citations · 22 references
Thermo-mechanical ReliabilityElectrical EngineeringEngineeringAdvanced Packaging (Semiconductors)Hardware ReliabilityMechanical EngineeringChip AttachmentSolid MechanicsElectronic PackagingDevice ReliabilityMicroelectronicsMechanics Of MaterialsPhysic Of Failure
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Fatigue life models for SnAgCu and SnPb solder joints evaluated by experiments and simulation
Andreas Schubert, R. Dudek, E. Auerswald et al. · 2003 · 383 citations