Concepedia

Publication | Open Access

Grain boundary-driven leakage path formation in HfO2 dielectrics

DOIFull Paper Access

143

Citations

15

References

2011

Year

G. Bersuker, J. Yum, Luca Vandelli, Andrea Padovani, Luca Larcher, V. Iglesias, M. Porti, M. Nafrı́a, Keith P. McKenna, Alexander L. Shluger,
Solid-State Electronics

References

YearCitations

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