Concepedia

Author

Luca Vandelli

University of Modena and Reggio Emilia

Also Known As

L. Vandelli, Luca Vandelli

46

Publications

2K

Citations

19

H-Index

55

Concepts

All Affiliations

University of Modena and Reggio EmiliaUniversity College LondonIMECUniversitat Autònoma de BarcelonaFerrari (Italy)
LV

About

Luca Vandelli is an author at University of Modena and Reggio Emilia specializing in engineering, electrical engineering, and applied physics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

19

25

1.9K

2

Applied Physics

19

24

1.9K

3

Electrical Engineering

19

24

1.8K

4

Computer Engineering

4

4

120

5

Natural Sciences

1

1

33

Luca Vandelli

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25

Publications

1.9K

Citations

19

H-Index

YearCitations

Metal oxide resistive memory switching mechanism based on conductive filament properties

G. Bersuker, D. C. Gilmer, Dmitry Veksler,

Journal of Applied Physics

2011

468

A Physical Model of the Temperature Dependence of the Current Through $\hbox{SiO}_{2}\hbox{/}\hbox{HfO}_{2}$ Stacks

Luca Vandelli, Andrea Padovani, Luca Larcher,

IEEE Transactions on Electron Devices

2011

256

Microscopic Modeling of HfO<sub><italic>x</italic></sub> RRAM Operations: From Forming to Switching

Andrea Padovani, Luca Larcher, Onofrio Pirrotta,

IEEE Transactions on Electron Devices

2015

209

Grain boundary-driven leakage path formation in HfO2 dielectrics

G. Bersuker, J. Yum, Luca Vandelli,

Solid-State Electronics

2011

143

Metal oxide RRAM switching mechanism based on conductive filament microscopic properties

G. Bersuker, D. C. Gilmer, Dekel Veksler,

2010

121

Random telegraph noise (RTN) in scaled RRAM devices

Dmitry Veksler, G. Bersuker, Luca Vandelli,

2013

92

Microscopic Modeling of Electrical Stress-Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics

Luca Vandelli, Andrea Padovani, Luca Larcher,

IEEE Transactions on Electron Devices

2013

87

A Compact Model of Program Window in HfO<sub>&lt;italic&gt;x&lt;/italic&gt;</sub> RRAM Devices for Conductive Filament Characteristics Analysis

Luca Larcher, Francesco Maria Puglisi, Paolo Pavan,

IEEE Transactions on Electron Devices

2014

73

Experimental and theoretical study of electrode effects in HfO&lt;inf&gt;2&lt;/inf&gt; based RRAM

C. Cagli, Julien Buckley, V. Jousseaume,

2011

71

Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices

Luca Vandelli, Andrea Padovani, Luca Larcher,

2011

65

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