Trade-off analysis of the p-base doping on ruggedness of SiC MOSFETs - Concepedia

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Trade-off analysis of the p-base doping on ruggedness of SiC MOSFETs

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22

Citations

9

References

2017

Year

Bhagyalakshmi Kakarla, Selamnesh Nida, Johanna Mueting, Thomas Ziemann, Ivana Kovacevic-Badstuebner

Microelectronics Reliability

Electrical EngineeringSemiconductor DeviceEngineeringPower DeviceTrade-off AnalysisPower Semiconductor DeviceMicroelectronicsCarbideSic MosfetsP-base Doping

References

	Year	Citations

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