Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs - Concepedia

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Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs

DOI Full Paper Access

66

Citations

6

References

2015

Year

Cheng Chen, Denis Labrousse, Stéphane Lefebvre, Mickaël Petit, Cyril Buttay, Hervé Morel

Microelectronics Reliability

Electrical EngineeringReliability EngineeringEngineeringHardware ReliabilityPower DeviceShort-circuit RobustnessBias Temperature InstabilityPower Semiconductor DeviceFailure ModesCircuit ReliabilityPower ElectronicsSic Mosfets

References

	Year	Citations

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