Concepedia

Contemporary CMOS aging mitigation techniques: Survey, taxonomy, and methods

Navid Khoshavi, Rizwan A. Ashraf, Ronald F. DeMara, Saman Kiamehr, Fabian Oboril, Mehdi B. Tahoori

Integration · 2017 · 38 citations · 95 references

Open access

Concepts

EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSystem-on-chip DesignClock GatingCmos Circuit DesignDevice ReliabilityDynamic Power ReductionLeakage Power ReductionPower ManagementCmos ReliabilityCmos ScalingDevice DegradationGate Oxide DegradationHot-carrier Degradation

References

95

Physical unclonable functions for device authentication and secret key generation

G. Edward Suh, Srinivas Devadas · Proceedings - ACM IEEE Design Automation Conference · 2007 · 2.1K citations

Computing, Computer Engineering, Electrical Engineering +16

Razor: a low-power pipeline based on circuit-level timing speculation

Dan Ernst, Nam Sung Kim, Shidhartha Das et al. · 2003 · 1.1K citations

Engineering, Computer Engineering, Electrical Engineering +16

Razor: a low-power pipeline based on circuit-level timing speculation

Daniel Ernst, Nam Sung Kim, Shidhartha Das et al. · 2004 · 842 citations

Engineering, Computer Engineering, Electrical Engineering +16

Physical Unclonable Functions for Device Authentication and Secret Key Generation

G. Edward Suh, Srinivas Devadas · Proceedings - ACM IEEE Design Automation Conference · 2007 · 517 citations · Full text

Computing, Computer Engineering, Electrical Engineering +16

NBTI degradation: From physical mechanisms to modelling

V. Huard, M. Denais, C. Parthasarathy · Microelectronics Reliability · 2005 · 503 citations

Engineering, Electrical Engineering, Electronic Materials +10