Materials Science in Semiconductor Processing · 2016 · 64 citations · 33 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDopingOptical Properties Of SemiconductorsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsThermal Properties Of SemiconductorsDoping Effects On Device PerformanceLaser AnnealingSemiconductor DopingThermal AnnealingThermal Annealing Effects
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Ohmic contact formation mechanism of Ni on n-type 4H–SiC
Sang Youn Han, Ki-Hong Kim, Jong Kyu Kim et al. · Applied Physics Letters · 2001 · 156 citations
P. Batude, T. Ernst, Julien Arcamone et al. · IEEE Journal on Emerging and Selected Topics in Circuits and Systems · 2012 · 109 citations