2002 · 21 citations · 3 references
EngineeringElectrical EngineeringMaterials ScienceAnalog ElectronicsMicroelectronicsSemiconductor DevicesCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyDevice ModelingDevice ScalingDevice SimulationIntegrated Circuit DesignCmos Analog Integrated CircuitsDevice Mismatch AnalysisDevice OptimizationMismatchMismatch AnalysisResistive MatchingResistor MatchingResistors
We investigate the matching behaviour of poly-silicon resistors. Experimental results from an analog CMOS process with three poly-silicon options are discussed and compared with a quantitative model which is developed using fit parameter-free analytical calculations and Monte-Carlo simulations. It is found that mismatch is directly proportional to the grain size. A relation is derived that allows us to optimize devices for low mismatch circuit applications.
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