Device Mismatch Analysis
Device Mismatch Analysis is a systematic methodology within analog and mixed-signal integrated circuit design that characterizes and quantifies the deviations in electrical parameters between nominally identical semiconductor devices arising from manufacturing process variations, thereby enabling the prediction and improvement of circuit performance yield and reliability.
338
Publications
12.8K
Citations
971
Authors
297
Institutions
Publications per year
2017–2026
41
338
Transistor matching in analog CMOS applications
Marcel Pelgrom, Hans Tuinhout, M. Vertregt · 2002 · 306 citations
1–5 of 338
971
14
h-index
8
h-index
Institut de Microélectronique, Electromagnétisme et Photonique, France
7 publications · 163 citations
7
h-index
7
h-index
6
h-index
1–5 of 971
297
Philips (Netherlands)
Amsterdam, The Netherlands
12 h-index
31 publications
1.9K citations
STMicroelectronics (France)
Montrouge, France
12 h-index
37 publications
1.3K citations
Texas Instruments (United States)
Dallas, United States
10 h-index
41 publications
912 citations
Motorola (United States)
Schaumburg, United States
10 h-index
28 publications
1.3K citations
Institut de Microélectronique, Electromagnétisme et Photonique
Grenoble, France
9 h-index
20 publications
568 citations
University of California, Berkeley
Berkeley, United States
9 h-index
23 publications
762 citations
KU Leuven
Leuven, Belgium
9 h-index
30 publications
1.9K citations
IBM (United States)
Armonk, United States
9 h-index
22 publications
435 citations
1–8 of 297
26 publications · 2.8K citations
21
h-index
18 publications · 668 citations
15
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9 publications · 264 citations
9
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8 publications · 204 citations
8
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7 publications · 210 citations
7
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