Device Mismatch Analysis

Device Mismatch Analysis is a systematic methodology within analog and mixed-signal integrated circuit design that characterizes and quantifies the deviations in electrical parameters between nominally identical semiconductor devices arising from manufacturing process variations, thereby enabling the prediction and improvement of circuit performance yield and reliability.

338

Publications

12.8K

Citations

971

Authors

297

Institutions

Publications per year

2017–2026

41

Authors

971

  1. HT
    Hans Tuinhout

    Philips (Netherlands), Netherlands

    14 publications · 734 citations

    14

    h-index

  2. WS
    Willy Sansen

    KU Leuven, Belgium

    8 publications · 514 citations

    8

    h-index

  3. GG
    G. Ghibaudo

    Institut de Microélectronique, Electromagnétisme et Photonique, France

    7 publications · 163 citations

    7

    h-index

  4. PD
    P.G. Drennan

    Motorola (United States), United States

    7 publications · 467 citations

    7

    h-index

  5. PR
    Peter R. Kinget

    Columbia University, United States

    6 publications · 626 citations

    6

    h-index

1–5 of 971

Venues

  1. IEEE Journal of Solid-State Circuits

    26 publications · 2.8K citations

    21

    h-index

  2. 15

    h-index

  3. IEEE Transactions on Electron Devices

    9 publications · 264 citations

    9

    h-index

  4. Electronics Letters

    8 publications · 204 citations

    8

    h-index

  5. IEEE Electron Device Letters

    7 publications · 210 citations

    7

    h-index

1–5