U. Kollmer

Explanation and quantitative model for the matching behaviour of poly-silicon resistors

R. Thewes, Ralf Brederlow, C. Dahl et al. · 2002 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

Key attributes of an SRAM testing strategy required for effective process monitoring

J. Khare, S. Griep, H.-D. Oberle et al. · 2002 · 17 citations

Computing, Computer Engineering, Computer Science +17

ROS: an extremely high density mask ROM technology based on vertical transistor cells

E. Bertagnolli, F. Hofmann, J. Willer et al. · 2002 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +16

What Do Matching Results of Medium Area MOSFETs Reveal for Large Area Devices in Typical Analog Applications

C. Linnenbank, W. Weber, U. Kollmer et al. · European Solid-State Device Research Conference · 1998 · 12 citations

Engineering, Electrical Engineering, Analog Electronics +15

On the matching behavior of MOSFET small signal parameters

R. Thewes, C. Linnenbank, U. Kollmer et al. · 2002 · 12 citations

Engineering, Electrical Engineering, Circuit Theory +14