Russian Microelectronics · 2016 · 24 citations · 15 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsRadiation DetectionSystem-on-chip DesignAbsorbed DoseBuilt-in Self-testDesign For TestabilityPhysical DesignRadiation HardeningRadiation SensitivityHardnessRadiation HardnessRadiation-hard DevicesRadiation-hard ElectronicsRadiation-hardened Integrated Circuits
The analysis results of typical radiation faults of the system-on-chip have been presented. The specifics of digital, analog-to-digital (mixed), and microwave system-on-chip are considered. A set of the basic parameters-criteria for the radiation hardness of system-on-chip of various classes is determined. Methodical and technical designs for controlling the operability of the System-on-chip by carrying out radiation tests are proposed.
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System on module total ionizing dose distribution modeling
Alexey O. Akhmetov, Dmitry V. Boychenko, D. V. Bobrovskiy et al. · 2014 · 28 citations