Facta universitatis - series Electronics and Energetics · 2014 · 23 citations · 9 references
EngineeringComputer EngineeringElectrical EngineeringRadiation MeasurementRadiation PhysicsRadiation SafetyAbsorbed DoseRadiation Dose MeasurementComponent-level Radiation TestingHardnessRadiation HardnessRadiation TestingRadiation-hard DevicesRadiation-hard ElectronicsRadiation-hardened Integrated CircuitsX-ray Irradiation
A method is proposed to test microelectronic parts total ionizing dose hardness based on a rationally balanced combination of gamma- and X-ray irradiation facilities. The scope of this method is identified, and a step-by-step algorithm of combined testing is provided, along with a test example of the method application.
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